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dc.contributor.authorKuzmenko, Iuriy
dc.contributor.authorSamoilenko, Olexandr
dc.contributor.authorTsiporenko, Serhiy
dc.date.accessioned2022-05-23T11:23:54Z-
dc.date.available2022-05-23T11:23:54Z-
dc.date.created2021-02-23
dc.date.issued2021-02-23
dc.identifier.citationKuzmenko I. Multipurpose measurement models for adjustment by the least-squares method / Iuriy Kuzmenko, Olexandr Samoilenko, Serhiy Tsiporenko // Measuring equipment and metrology. — Lviv : Lviv Politechnic Publishing House, 2021. — Vol 82. — No 2. — P. 29–37.
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/56830-
dc.description.abstractThe development of multipurpose measurement models is the precondition for software development for simultaneous adjustment of the large scope and complicated combinations of the measurement results by the least-squares method. Multipurpose measurement models for software can be a helpful tool for processing the final measurement results provided by different measurement methods applying the mentioned software; processing the measurement results of measurement standards comparisons, interlaboratory comparison, and calibration procedures; estimating the additive and multiplicative systematic components of measurement errors and their uncertainty; processing complicated combinations by binding or linking up of the interlaboratory comparison and calibration results in the time; simultaneous processing of the measurement results obtained by various methods e.g. by the method of direct measurements and comparisons; fast-changing the multipurpose measurement models from linear to non-linear type. Processing of the results by software based on the multipurpose measurement model algorithm can help to established a comprehensive measurement traceability network by pooling the single traceability chains.
dc.format.extent29-37
dc.language.isoen
dc.publisherВидавництво Львівської політехніки
dc.publisherLviv Politechnic Publishing House
dc.relation.ispartofВимірювальна техніка та метрологія, 2 (82), 2021
dc.relation.ispartofMeasuring equipment and metrology, 2 (82), 2021
dc.relation.urihttps://doi.org/10.1023/A:1025373701977
dc.relation.urihttp://iopscience.iop.org/0026-1394/41/3/003
dc.relation.urihttp://iopscience.iop.org/article/10.1088/0026-1394/49/3/340
dc.relation.urihttp://iopscience.iop.org/0026-394/13/050549
dc.relation.urihttps://www.iso.org/standard/29366.html
dc.subjectMultipurpose measurement models
dc.subjectLeast-squares method
dc.subjectMeasurement subjects and objects
dc.subjectComprehensive measurement traceability network
dc.subjectUncertainty
dc.titleMultipurpose measurement models for adjustment by the least-squares method
dc.typeArticle
dc.rights.holder© Національний університет “Львівська політехніка”, 2021
dc.contributor.affiliationState Enterprise “Ukrmetrteststandard”
dc.format.pages9
dc.identifier.citationenKuzmenko I. Multipurpose measurement models for adjustment by the least-squares method / Iuriy Kuzmenko, Olexandr Samoilenko, Serhiy Tsiporenko // Measuring equipment and metrology. — Lviv : Lviv Politechnic Publishing House, 2021. — Vol 82. — No 2. — P. 29–37.
dc.identifier.doihttps://doi.org/10.23939/istcmtm2021.02.029
dc.relation.references[1] JCGM 200:2012. International vocabulary of metrology – Basic and general concepts and associated terms (VIM).
dc.relation.references[2] M. G. Cox, The evaluation of key comparison data. Metrologia. V. 39, p. 589–595, 2002.
dc.relation.references[3] Nielsen, L. Identification and handling of discrepant measurements in key comparisons. Measurement Techniques. 46(5), 513–522, 2003: https://doi.org/10.1023/A:1025373701977.
dc.relation.references[4] D. R. White On the analysis of measurement comparisons. Metrologia. V. 41, 2004, IOPscience (http://iopscience.iop.org/0026-1394/41/3/003).
dc.relation.references[5] A. Koo, J. F. Clare On the equivalence of generalized least-squares approaches to the evaluation of measurement comparisons. Metrologia. V. 49, 2012, IOPscience (http://iopscience.iop.org/article/10.1088/0026-1394/49/3/340).
dc.relation.references[6] C. Elster, B. Toman Analysis of key comparison data: a critical assessment of elements of current practice with suggested improvement. Metrologia. Vol. 50, 2013, IOPscience (http://iopscience.iop.org/0026-394/13/050549).
dc.relation.references[7] Iu. Kuzmenko, O. Samoilenko Processing by least squares method of the measurement results for key, regional and supplementary comparison of the measurement standards. Metrology and Instruments. No. 2, pp. 3–13, 2018.
dc.relation.references[8] JCGM 100:2008. Evaluation of measurement data – Guide to the expression of uncertainty in measurement.
dc.relation.references[9] ISO 17123-4:2012. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments. Part 4: Electro-optical distance meter (EDM measurements to reflectors).
dc.relation.references[10] O. Samoilenko, O. Adamenko Length measurement results processing for adjustment or calibration of distance meters and tachometers on the infield comparator, Sc. & Techn. Anthology “Geodesy, cartography and aerophotography”, Pub. 90, pp. 15–28, 2019.
dc.relation.references[11] R. Schwartz, M. Borys, F. Scholz Guide to Mass Determination with High Accuracy PTB-MA-80, Physikalisch- Technische Bundesanstalt Braunschweig und Berlin Presse, 2007.
dc.relation.references[12] O. Samoilenko, O. Adamenko, V. Kalinichenko O. Methodic and results of the moving laser interferometers direct adjustments Renishaw XL-80. Metrology and Instruments, No. 4, 2018.
dc.relation.references[13] JCGM 102:2008. Evaluation of measurement data – Supplement 2 to the “Guide to the expression of uncertainty in measurement” Extension to any number of output quantities.
dc.relation.references[14] JCGM 103 CD 2018-10-04. Evaluation of measurement data – Supplement 2 to the “Guide to the expression of uncertainty in measurement” Developing and using measurement models.
dc.relation.references[15] ILAC P 10:2002. ILAC Policy on traceability of measurement results. International Laboratory Accreditation Cooperation.
dc.relation.references[16] ISO 13528:2005. Statistical methods for use in proficiency testing by interlaboratory comparisons.
dc.relation.references[17] ISO/IEC 17043:2010, IDT. Conformity assessment – General requirements for proficiency testing, https://www.iso.org/standard/29366.html.
dc.relation.references[18] ISO/IEC 17025:2006 General requirements for the competence of testing and calibration laboratories, IDT.
dc.relation.references[19] C. Lawson, R. Henson 1986 Solving Least Squares Problems/Trans. from English. Science. Head Editor phys.- mat. lit. p. 232.
dc.relation.referencesen[1] JCGM 200:2012. International vocabulary of metrology – Basic and general concepts and associated terms (VIM).
dc.relation.referencesen[2] M. G. Cox, The evaluation of key comparison data. Metrologia. V. 39, p. 589–595, 2002.
dc.relation.referencesen[3] Nielsen, L. Identification and handling of discrepant measurements in key comparisons. Measurement Techniques. 46(5), 513–522, 2003: https://doi.org/10.1023/A:1025373701977.
dc.relation.referencesen[4] D. R. White On the analysis of measurement comparisons. Metrologia. V. 41, 2004, IOPscience (http://iopscience.iop.org/0026-1394/41/3/003).
dc.relation.referencesen[5] A. Koo, J. F. Clare On the equivalence of generalized least-squares approaches to the evaluation of measurement comparisons. Metrologia. V. 49, 2012, IOPscience (http://iopscience.iop.org/article/10.1088/0026-1394/49/3/340).
dc.relation.referencesen[6] C. Elster, B. Toman Analysis of key comparison data: a critical assessment of elements of current practice with suggested improvement. Metrologia. Vol. 50, 2013, IOPscience (http://iopscience.iop.org/0026-394/13/050549).
dc.relation.referencesen[7] Iu. Kuzmenko, O. Samoilenko Processing by least squares method of the measurement results for key, regional and supplementary comparison of the measurement standards. Metrology and Instruments. No. 2, pp. 3–13, 2018.
dc.relation.referencesen[8] JCGM 100:2008. Evaluation of measurement data – Guide to the expression of uncertainty in measurement.
dc.relation.referencesen[9] ISO 17123-4:2012. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments. Part 4: Electro-optical distance meter (EDM measurements to reflectors).
dc.relation.referencesen[10] O. Samoilenko, O. Adamenko Length measurement results processing for adjustment or calibration of distance meters and tachometers on the infield comparator, Sc. & Techn. Anthology "Geodesy, cartography and aerophotography", Pub. 90, pp. 15–28, 2019.
dc.relation.referencesen[11] R. Schwartz, M. Borys, F. Scholz Guide to Mass Determination with High Accuracy PTB-MA-80, Physikalisch- Technische Bundesanstalt Braunschweig und Berlin Presse, 2007.
dc.relation.referencesen[12] O. Samoilenko, O. Adamenko, V. Kalinichenko O. Methodic and results of the moving laser interferometers direct adjustments Renishaw XL-80. Metrology and Instruments, No. 4, 2018.
dc.relation.referencesen[13] JCGM 102:2008. Evaluation of measurement data – Supplement 2 to the "Guide to the expression of uncertainty in measurement" Extension to any number of output quantities.
dc.relation.referencesen[14] JCGM 103 CD 2018-10-04. Evaluation of measurement data – Supplement 2 to the "Guide to the expression of uncertainty in measurement" Developing and using measurement models.
dc.relation.referencesen[15] ILAC P 10:2002. ILAC Policy on traceability of measurement results. International Laboratory Accreditation Cooperation.
dc.relation.referencesen[16] ISO 13528:2005. Statistical methods for use in proficiency testing by interlaboratory comparisons.
dc.relation.referencesen[17] ISO/IEC 17043:2010, IDT. Conformity assessment – General requirements for proficiency testing, https://www.iso.org/standard/29366.html.
dc.relation.referencesen[18] ISO/IEC 17025:2006 General requirements for the competence of testing and calibration laboratories, IDT.
dc.relation.referencesen[19] C. Lawson, R. Henson 1986 Solving Least Squares Problems/Trans. from English. Science. Head Editor phys, mat. lit. p. 232.
dc.citation.journalTitleВимірювальна техніка та метрологія
dc.citation.volume82
dc.citation.issue2
dc.citation.spage29
dc.citation.epage37
dc.coverage.placenameЛьвів
dc.coverage.placenameLviv
Appears in Collections:Вимірювальна техніка та метрологія. – 2021. – Випуск 82, №1

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