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Please use this identifier to cite or link to this item: https://oldena.lpnu.ua/handle/ntb/5670
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dc.contributor.authorPaszkowicz, Wojciech-
dc.date.accessioned2010-06-21T12:06:50Z-
dc.date.available2010-06-21T12:06:50Z-
dc.date.issued2009-
dc.identifier.citationPaszkowicz W. High-pressure x-ray diffraction techniques: application to determination of the equation of state of selected multicomponent oxides / W. Paszkowicz // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 60.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/5670-
dc.language.isoenuk_UA
dc.publisherВидавництво національного університету „Львівська політехніка”uk_UA
dc.subjectNobel laureateuk_UA
dc.subjectfulfill specificuk_UA
dc.subjectX-rayuk_UA
dc.titleHigh-pressure x-ray diffraction techniques: application to determination of the equation of state of selected multicomponent oxidesuk_UA
dc.typearticleuk_UA
Appears in Collections:Оксидні матеріали електронної техніки – отримання, властивості, застосування. – 2009 р.

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