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Please use this identifier to cite or link to this item: https://oldena.lpnu.ua/handle/ntb/5557
Title: Remanent resistance changes at pcmo-metal interfaces: electrical induced polaron ordering
Authors: Meyer, B.-U.
Scherff, M.
Hoffmann, J.
Whu, L.
Zhu, Y.
Jooss, Ch.
Bibliographic description (Ukraine): Remanent resistance changes at pcmo-metal interfaces: electrical induced polaron ordering / B.-U. Meyer, M. Scherff, J. Hoffmann, L. Whu, Y. Zhu, Ch. Jooss // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 147.
Issue Date: 2009
Publisher: Видавництво національного університету „Львівська політехніка”
Keywords: electric pulse induced resistance changes (EPIR)
RRAM-technologies
URI: https://ena.lpnu.ua/handle/ntb/5557
Content type: article
Appears in Collections:Оксидні матеріали електронної техніки – отримання, властивості, застосування. – 2009 р.

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