https://oldena.lpnu.ua/handle/ntb/5287
Title: | Trace impurities, intrinsic and radiation defects in oxide materials |
Authors: | Grachev, V. Malovichko, G. Jorgensen, J. Meyer, M. Pankratov, V. Burak, Ya. Hunt, A. |
Bibliographic description (Ukraine): | Trace impurities, intrinsic and radiation defects in oxide materials / V. Grachev, G. Malovichko, J. Jorgensen, M. Meyer, V. Pankratov, Ya. Burak, A. Hunt // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 113. |
Issue Date: | 2009 |
Publisher: | Видавництво національного університету “Львівська політехніка” |
Keywords: | Electron Paramagnetic Resonance (EPR) NASA |
URI: | https://ena.lpnu.ua/handle/ntb/5287 |
Content type: | article |
Appears in Collections: | Оксидні матеріали електронної техніки – отримання, властивості, застосування. – 2009 р. |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.