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Please use this identifier to cite or link to this item: https://oldena.lpnu.ua/handle/ntb/5287
Title: Trace impurities, intrinsic and radiation defects in oxide materials
Authors: Grachev, V.
Malovichko, G.
Jorgensen, J.
Meyer, M.
Pankratov, V.
Burak, Ya.
Hunt, A.
Bibliographic description (Ukraine): Trace impurities, intrinsic and radiation defects in oxide materials / V. Grachev, G. Malovichko, J. Jorgensen, M. Meyer, V. Pankratov, Ya. Burak, A. Hunt // Oxide materials for electronic engineering – fabrication, properties and application OMEE-2009 : international scientific workshop, June 22–26, 2009, Lviv, Ukraine : book of abstracts / Lviv Polytechnic National University. – Lviv, 2009. – P. 113.
Issue Date: 2009
Publisher: Видавництво національного університету “Львівська політехніка”
Keywords: Electron Paramagnetic Resonance (EPR)
NASA
URI: https://ena.lpnu.ua/handle/ntb/5287
Content type: article
Appears in Collections:Оксидні матеріали електронної техніки – отримання, властивості, застосування. – 2009 р.

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