https://oldena.lpnu.ua/handle/ntb/42627| Title: | Aspects of EMC- Evaluation of LIN- Transceivers |
| Authors: | Körber, B. Sperling, D. Kalita, W. Sabat, W. |
| Affiliation: | FTZ e.V. an der Westsächsischen Hochschule Zwickau (FH), University of Applied Sciences, Zwickau Rzeszów University of Technology |
| Bibliographic description (Ukraine): | Aspects of EMC- Evaluation of LIN- Transceivers / B. Körber, D. Sperling, W. Kalita, W. Sabat // Вісник Національного університету "Львівська політехніка". – 2002. – № 458 : Елементи теорії та прилади твердотілої електроніки. – С. 286–289. – Bibliography: 4 titles. |
| Conference/Event: | Елементи теорії та прилади твердотілої електроніки |
| Issue Date: | 2002 |
| Publisher: | Видавництво Національного університету «Львівська політехніка» |
| Country (code): | UA |
| Place of the edition/event: | Львів |
| Number of pages: | 286–289 |
| Abstract: | With this paper a proposal for EMC- Evaluation of LIN (Line Integrated Network)-Transceiver is presented. It is based on EMC- standards for semiconductors and automotive applications and can be applied to Stand Alone LIN Transceiver and Embedded Systems with an on chip LIN Transceiver (Automotive System Basis Chips). At this time there are positive experiences by using this evaluation proposal on LIN Transceivers from different manufactures and samples in the last two years. It can be shown, that the results of the measurements have a very good reproducibility. The proposal for EMC- Evaluation of LIN- Transceivers is based on the same procedure as EMC- Evaluation of CAN – Transceivers, witch is successful implemented in Transceiver evaluation for automotive applications and has a correlation to vehicle measurements. |
| URI: | https://ena.lpnu.ua/handle/ntb/42627 |
| References (Ukraine): | [1] DIN - IEC 62132 Integrierte Schaltungen – Messung der elektromagnetischen Störfestigkeit. [2] IC IEC 61967, Integrated circuits- Measurement of Electromagnetic Emissions. [3] EN 61000-4-2, Electrostatic Discharge Testing [4] Pfaff W., Scheider G., Störfestigkeitsprüfungen von Halbleiterschaltkreisen. EMC Kompedium 2000. |
| Content type: | Article |
| Appears in Collections: | Елементи теорії та прилади твердотілої електроніки. – 2002. – №458 |
| File | Description | Size | Format | |
|---|---|---|---|---|
| 55_286-289.pdf | 221.69 kB | Adobe PDF | View/Open |
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