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Please use this identifier to cite or link to this item: https://oldena.lpnu.ua/handle/ntb/42540
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dc.contributor.authorZlonkiewicz, Zbigniew-
dc.date.accessioned2018-08-28T14:44:21Z-
dc.date.available2018-08-28T14:44:21Z-
dc.date.issued2002-
dc.identifier.citationZlonkiewicz Z. Low-current contacts analysis with the application of mathematical-physical models / Z. Zlonkiewicz // Вісник Національного університету "Львівська політехніка". – 2002. – № 458 : Елементи теорії та прилади твердотілої електроніки. – С. 180–188. – Bibliography: 13 titles.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/42540-
dc.description.abstractThe paper presents the results of modelling of contacts used in low current circuits. Mathematical and physical models are useful in the analysis of such contacts to describe the complex real shape of contact areas. FLUX 2D packages have been used for simulations assuming contact model in the form of an ellipse. The selected contacts are covered with a hard golden layer on a PdNi20 beneath layer. The distribution of current intensity, power and voltage in the contact areas has been determined.uk_UA
dc.language.isoenuk_UA
dc.publisherВидавництво Національного університету "Львівська політехніка"uk_UA
dc.subjectcontactuk_UA
dc.subjectmodellinguk_UA
dc.subjectfinite elementsuk_UA
dc.titleLow-current contacts analysis with the application of mathematical-physical modelsuk_UA
dc.typeArticleuk_UA
dc.rights.holder© Zbigniew Zlonkiewicz, 2002uk_UA
dc.contributor.affiliationTechnical University of Lublin, Institute of Fundamental Electrical Engineering and Electrotechnology, Polanduk_UA
dc.coverage.countryUAuk_UA
dc.format.pages180–188-
dc.relation.references5. FLUX 2D, Version 7.1. CAD Package for electromagnetic and thermal analysis. User’s Guide. CEDRAT 1994. 6. ( % (&6 % % % + % + % , + % -niklowych w , + % & % % 2 % 7 $!!5 & 7. ( % (6 *-Nickel Conductive Coating in Low Current Engineering. 8th International Conference on Switching Arc Phenomena on Electrical Technologies for 8 * '9 :-6.09.97, pp. 222-225 8. ( % (&6 ; % + % * * * *;& <= Naukowo -Techniczna: ZASTOSOWANIA KOMPUTERÓW w ELEKTROTECHNICE - ( % >!! / $)-14 kwietnia 1999, str. 185-188 9. ( % (&6 ; * * - % + 9% + % ,; = 2 kowo - Techniczna: Zastosowania *+ 9% % , / $1 - 12 kwietnia 2000, str. 675-678 10. ( % (&6 ;3 + -Layer Contact Simulations" Electromagnetic Devices and Processes in 8 * 7 2 9% 1? - 06 czerwca 2000, pp. 231-237 11. ( % (&6 ;3, * @ 7 %-Current Contacts Modelled by Numerical Methods" Proceedings of 20th International Conference on Electrical Contacts, Stockholm Sweden, 19 - 23 June 2000, pp. 251-254 12. ( % (&6 AComputer Simulation of Low Current Contacts”. 9th International Conference 13. #% , @ , * '9 # + * $B-20, 2001, pp. 241-246uk_UA
dc.citation.journalTitleЕлементи теорії та прилади твердотілої електроніки-
dc.coverage.placenameЛьвівuk_UA
Appears in Collections:Елементи теорії та прилади твердотілої електроніки. – 2002. – №458

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