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Please use this identifier to cite or link to this item: https://oldena.lpnu.ua/handle/ntb/33149
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dc.contributor.authorKostrobij, P. P.-
dc.contributor.authorGrygorchak, I. I.-
dc.contributor.authorIvaschyshyn, F. O.-
dc.contributor.authorMarkovych, B. M.-
dc.contributor.authorViznovych, O. V.-
dc.contributor.authorTokarchuk, M. V.-
dc.date.accessioned2016-06-13T08:17:35Z-
dc.date.available2016-06-13T08:17:35Z-
dc.date.issued2015-
dc.identifier.citationMathematical modeling of subdiffusion impedance in multilayer nanostructures / P. P. Kostrobij, I. I. Grygorchak, F. O. Ivaschyshyn, B. M. Markovych, O. V. Viznovych, M. V. Tokarchuk // Mathematical Modeling and Сomputing. – 2015. – Volume 2, number 2. – Р. 154–159. – Bibliography: 25 titles.uk_UA
dc.identifier.urihttps://ena.lpnu.ua/handle/ntb/33149-
dc.description.abstractThe model of impedance subdiffusion based on the Cattaneo equation in fractional derivatives in applications to multilayer nanostructures is considered. Nyquist diagrams with changes of the parameter (time for which the flow is delayed with respect to the concentration gradient) and the subdiffusion coefficient D are calculated. Розглянуто модель субдифузiйного iмпедансу на основi рiвняння Кеттано у дробових похiдних у застосуваннi до мультишарових наноструктур. Розраховано дiаграми Найквiста iз змiною параметрiв (час, на який потiк затримується вiдносно градiєнта концентрацiї) та субдифузiйного коефiцiєнта D.uk_UA
dc.language.isoenuk_UA
dc.publisherPublishing House of Lviv Polytechnic National Universityuk_UA
dc.subjectfractional derivativeuk_UA
dc.subjectCattaneo equationuk_UA
dc.subjectNyquist diagramuk_UA
dc.subjectimpedanceuk_UA
dc.subjectдробова похiднаuk_UA
dc.subjectрiвняння Кеттаноuk_UA
dc.subjectдiаграма Найквiстаuk_UA
dc.subjectiмпедансuk_UA
dc.titleMathematical modeling of subdiffusion impedance in multilayer nanostructuresuk_UA
dc.title.alternativeМатематичне моделювання субдифузiйного iмпедансу в мультишарових наноструктурахuk_UA
dc.typeArticleuk_UA
Appears in Collections:Mathematical Modeling And Computing. – 2015. – Vol. 2, No. 2

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