| DC Field | Value | Language |
|---|
| dc.contributor.author | Andonova, A. S. | - |
| dc.contributor.author | Atanasova, N. G. | - |
| dc.date.accessioned | 2016-01-27T10:53:26Z | - |
| dc.date.available | 2016-01-27T10:53:26Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.citation | Andonova A. S. Testing algorithms for screening of large electronic systems / A. S. Andonova, N. G. Atanasova // Вісник Національного університету «Львівська політехніка». – 2004. – № 512 : Елементи теорії та прилади твердотілої електроніки. – С. 38–44. – Bibliography: 5 titles. | uk_UA |
| dc.identifier.uri | https://ena.lpnu.ua/handle/ntb/31135 | - |
| dc.description.abstract | When a hardware system is screening, a problem is when to stop the test and accept the system. Based on this these, the paper describes and evaluates seven possible algorithms. Three of these algorithms as most promising are tested with simulated data. Different systems are simulated, and 50 Monte Carlo simulations made on each system. The stop times generated by the algorithm is compared with the known perfect stop time. Of the three algorithms two is selected as good. These two algorithms are then tested on real data. The algorithms are tested with three different levels of confidence. The number of correct and wrong stop decisions are counted. The conclusion is that the Weibull algorithm with 90% confidence level takes the right decision in every one of the cases | uk_UA |
| dc.language.iso | ua | uk_UA |
| dc.publisher | Видавництво Національного університету «Львівська політехніка» | uk_UA |
| dc.title | Testing algorithms for screening of large electronic systems | uk_UA |
| dc.type | Article | uk_UA |
| Appears in Collections: | Елементи теорії та прилади твердотілої електроніки. – 2004. – № 512
|
