| 29-May-2017 | Negative Dynamic Resistance andMemristive Effects in Zincite-Tungsten Semiconductor Junction | Nowicki, M.; Nowak, P.; Szewczyk, R.; Institute of Metrology and Biomedical Engineering; Warsaw University of Technology; Boboli 8, 02-525 Warsaw, Poland; m.nowicki@mchtr.pw.edu.pl, * r.szewczyk@mchtr.pw.edu.pl; Industrial Research Institute for Automation and Measurements PIAP; Al. Jerozolimskie 202, 02-486 Warsaw, Poland; pnowak@piap.pl | | Conference Abstract | 29-May-2017 | Negative Dynamic Resistance andMemristive Effects in Zincite-Tungsten Semiconductor Junction | Nowicki, M.; Nowak, P.; Szewczyk, R. |
| 29-May-2017 | Utilization of Eddy Current Tomography for Testing Ferrite Rings | Nowak, P.; Nowicki, M.; Industrial Research Institute for Automation and Measurements PIAP; Al. Jerozolimskie 202, 02-486 Warsaw, Poland; pnowak@piap.pl; Institute of Metrology and Biomedical Engineering, Warsaw University of Technology; Boboli 8, 02-525 Warsaw, Poland; p.nowak@mchtr.pw.edu.pl, * m.nowicki@mchtr.pw.edu.pl | | Conference Abstract | 29-May-2017 | Utilization of Eddy Current Tomography for Testing Ferrite Rings | Nowak, P.; Nowicki, M. |
