| Preview | Issue Date | Title | Author(s) | Preview | Type | Issue Date | Title | Author(s) |
|---|---|---|---|---|---|---|---|---|
| 2004 | Minimizing time for test in integrated circuit | Andonova, A. S.; Dimitrov, D. G.; Atanasova, N. G. | Article | 2004 | Minimizing time for test in integrated circuit | Andonova, A. S.; Dimitrov, D. G.; Atanasova, N. G. |