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Browsing by Author Atanasova, N. G.

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2004Minimizing time for test in integrated circuitAndonova, A. S.; Dimitrov, D. G.; Atanasova, N. G.Article2004Minimizing time for test in integrated circuitAndonova, A. S.; Dimitrov, D. G.; Atanasova, N. G.
2004Testing algorithms for screening of large electronic systemsAndonova, A. S.; Atanasova, N. G.Article2004Testing algorithms for screening of large electronic systemsAndonova, A. S.; Atanasova, N. G.