| Preview | Issue Date | Title | Author(s) | Preview | Type | Issue Date | Title | Author(s) |
| 2004 | Minimizing time for test in integrated circuit | Andonova, A. S.; Dimitrov, D. G.; Atanasova, N. G. | | Article | 2004 | Minimizing time for test in integrated circuit | Andonova, A. S.; Dimitrov, D. G.; Atanasova, N. G. |
| 2004 | Practical considerations for lc differntial oscillators design | Nachev, R. G.; Ivanov, K. P.; Hristov, M. H.; Ovcharov, S. Y.; Andonova, A. S. | | Article | 2004 | Practical considerations for lc differntial oscillators design | Nachev, R. G.; Ivanov, K. P.; Hristov, M. H.; Ovcharov, S. Y.; Andonova, A. S. |
| 2004 | Testing algorithms for screening of large electronic systems | Andonova, A. S.; Atanasova, N. G. | | Article | 2004 | Testing algorithms for screening of large electronic systems | Andonova, A. S.; Atanasova, N. G. |
